I'm investigating reflectrometry thin film measurement. require help with spectrometer FFT analysis formulae
I understand basic principles relating thin film thickness wave length and refractive index.
When have unknown thickness use of white light illumination and spectrometer
Literature talks about use of FFT to produce histogram of probable thickness based on the diffraction pattern
Can anyone point me at the literature to review the formulae
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M$2 Answers
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M$Below is another document that talks about using an FT to do the same thing. You can probably adapt it to a FFT and do the same thing.
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M$
Sorry for the delayed reply. Thanks for the help. Currently following up.